An ideal inspection tool for all kinds of routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research. The Leica DM2700 M shows you how simple and reliable microscopy can be while helping to improve workflow.
Ultra-bright, high-power LED illumination provides a constant color temperature of 4500º K for brightfield, darkfield, interference contrast, polarized light, and oblique illumination methods. It offers real color imaging at all intensity levels. With a long lifetime and low power consumption, LEDs have enormous savings potential.
There are three microscope objective turrets to choose from - plus a 0.7x Macro objective that enables you to see almost 40 mm of a sample at a glance. This is ideal for fast orientation and overview documentation.
Samples with a size of up to 100 x100 mm - such as foils, wafers, and PCBs - and a thickness of up to 80 mm - e.g., machine components - can be examined using the ideal stage from Leica’s comprehensive line of microscope stages.
Inspection, process control, and defect analysis of silicon wafers or MEMS has to be fast and accurate. The Leica DM2700 M offers high optical resolution to detect even the smallest defects on the sample. The constant color temperature of LED illumination allows you to always see the sample in the same color.
The Leica DM2700 M is equipped, e.g. with an N PLAN achromatic objective series with magnifications from 5x to 100x, a field of view of 22 mm, a flattened image field, and large working distances.
The 0.7x Macro objective enables you to see almost 40 mm of a sample at a glance, which helps to get a fast orientation and overview of the sample.
Find out more on the Leica site
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